Johannessen, B.

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Article

Shirokoff, John W. and Young, C. K. and Brits, L. C. and Andrews, Gordon Todd and Johannessen, B. and Ridgway, M. C. (2007) Structural and elastic characterization of Cu-implanted SiO2 films on Si(100) substrates. Journal of Applied Physics, 101 (4). ISSN 0021-8979

This list was generated on Thu Aug 6 10:33:48 2020 NDT.