Johannessen, B.Group by: Item Type | No Grouping Number of items: 1. Shirokoff, John W. and Young, C. K. and Brits, L. C. and Andrews, Gordon Todd and Johannessen, B. and Ridgway, M. C. (2007) Structural and elastic characterization of Cu-implanted SiO2 films on Si(100) substrates. Journal of Applied Physics, 101 (4). ISSN 0021-8979 |
