Improving performance of parameter extractors through symbolic simulation

Zuberek, W. M. and Konczykowska, A. (1995) Improving performance of parameter extractors through symbolic simulation. In: Proceedings of the IEEE International Symposium on Industrial Electronics, 10-14 July 1995, Athens, Greece.

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In parameter extraction programs, the performance of repeated analyses of linear (or linearized) circuits can be significantly improved by representing the dependence of circuit responses on some parameters in a symbolic form. This symbolic form can then be evaluated very efficiently for different sets of parameter values. An integrated numerical-symbolic parameter extraction program, called FIT-S, has been developed in which all linear circuit analyses can be performed using a symbolic or numerical approach. A comparisons of execution times is presented for extraction of a submicron HEMT's parameters.

Item Type: Conference or Workshop Item (Paper)
Item ID: 14647
Department(s): Science, Faculty of > Computer Science
Date: July 1995
Date Type: Completion
Digital Object Identifier (DOI):
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