Kaderali, Ayiaz (2009) Investigating anisotropy and inhomogeneity using tomographic inversion of VSP traveltimes: validation of analytic expressions for linearly inhomogeneous elliptically anisotropic models. Masters thesis, Memorial University of Newfoundland.
[English]
PDF
- Accepted Version
Available under License - The author retains copyright ownership and moral rights in this thesis. Neither the thesis nor substantial extracts from it may be printed or otherwise reproduced without the author's permission. Download (14MB) |
Abstract
Tomographic inversions of zero-offset and walkaway VSP data were performed using an analytical traveltime expression for a linearly inhomogeneous elliptically anisotropic model. Both isotropic and anisotropic conditions were investigated by forward and inverse modelling. It was realized that to accommodate long offsets, i.e., beyond the turning-ray offset, the analytic equation for traveltime needed to be reformulated so that only single-valued functions were obtained with offset. -- A practical aspect of determining the elliptical anisotropy parameter, X, is in applying it in the expression for the curve that distinguishes between the downgoing and upgoing arrivals or 'turning points'. This has importance in the planning and designing of surveys, in that appropriate depths for receiver and source placements can be predetermined, with a reasonable estimation of inhomogeneity and anisotropy, to avoid acquiring data that would not be useful. -- Extensively applying the algorithm to a large volume of real and synthetic data is an indication of the robustness of the methodology.
Item Type: | Thesis (Masters) |
---|---|
URI: | http://research.library.mun.ca/id/eprint/9189 |
Item ID: | 9189 |
Additional Information: | Includes bibliographical references (leaves 101-104) |
Department(s): | Science, Faculty of > Earth Sciences |
Date: | 2009 |
Date Type: | Submission |
Library of Congress Subject Heading: | Anisotropy; Inhomogeneous materials; Seismic traveltime inversion; Vertical seismic profiling |
Actions (login required)
View Item |