Characterization and mathematical modeling of the structure of Canadian crude asphalt binders by x-ray diffraction

Futheiz, Ibrahim Abdulkarim (2017) Characterization and mathematical modeling of the structure of Canadian crude asphalt binders by x-ray diffraction. Masters thesis, Memorial University of Newfoundland.

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Eight samples of asphalt binder were retrieved from the provinces of Ontario and Alberta, Canada. Then they were pre-processed in thin film (1mm) on glass slides. X-ray diffraction (XRD) is used to perform profile fits, aromaticity and crystallite parameters in asphalt binder samples, and patterns were gotten by employing monochromatic Cu-K-a radiation (40kV and 40mA) using a Rigaku DMax 2200V-PC. Additionally, profile fitting was carried out by applying Pearson VII and Pseudo-Voigt functions from 5° to 35° as well as 60° to 110°= 2θ. The broadening of the diffraction line was simulated and analyzed using X-ray thin film. Outcome indicated a notable relationship between Pearson VII, Pseudo-Voigt, and Generalized Fermi Function (GFF). X-ray line broadening experiments using either the integral or full width at half maximum (FWHM) from diffraction lines are employed in order to simulate X-ray line profiles that emerged from the samples. For researchers as well as workers in the field, issues such as rutting of asphalt pavements in hot environments and cracking in cold ones are issues that not only persist but remain unresolved. Therefore, with the aim of enhancing asphalt pavement performance, it is worth examining compositional and structural characteristics in binders on a microscopic level.

Item Type: Thesis (Masters)
Item ID: 13072
Additional Information: Includes bibliographical references (pages 85-117).
Keywords: Asphalt binder, X-ray diffraction, GFF, Asphaltene
Department(s): Engineering and Applied Science, Faculty of
Date: September 2017
Date Type: Submission
Library of Congress Subject Heading: Asphalt -- Mechanical properties; Binders (Materials) -- Mechanical properties; Asphalt -- Radiography

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