Zuberek, W. M. and Konczykowska, A. (1990) TEGESED, a tool for efficient technological and geometrical characterization of semiconductor devices. In: European Design Automation Conf. (EDAC'90), 12-15 March, 1990, Glasgow, Scotland.
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Abstract
Characterization of semiconductor devices in terms of their technological and geometrical parameters is de- scribed in this paper. This characterization is generated by a software tool composed of the SPICE-PAC simula- tion package and the symbolic simulator SYBILIN. The paper discusses the general structure of the program, its principle of operation, some implementation details, and its computational efficiency. A characterization of Heterojunction Bipolar Transistor (HBT) for microwave applications is used as an illustration.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| URI: | http://research.library.mun.ca/id/eprint/14772 |
| Item ID: | 14772 |
| Additional Information: | DOI number in PDF links to wrong paper. |
| Keywords: | Parameter extraction, circuit simulation, SPICE-PAC, TEGESED |
| Department(s): | Science, Faculty of > Computer Science |
| Date: | March 1990 |
| Date Type: | Completion |
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