Quantifying disorder in colloidal films spin-coated onto patterned substrates

Aslam, Raheema and Ardanza-Trevijano, Sergio and Poduska, Kristin M. and Yethiraj, Anand and González-Viñas, Wenceslao (2017) Quantifying disorder in colloidal films spin-coated onto patterned substrates. Physical Review E, 95 (3). ISSN 1550-2376

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Abstract

Polycrystals of thin colloidal deposits, with thickness controlled by spin-coating speed, exhibit axial symmetry with local 4-fold and 6-fold symmetric structures, termed orientationally correlated polycrystals (OCPs). While spin-coating is a very facile technique for producing large-area colloidal deposits, the axial symmetry prevents us from achieving true long-range order. To obtain true long-range order, we break this axial symmetry by introducing a patterned surface topography and thus eliminate the OCP character. We then examine symmetry independent methods to quantify order in these disordered colloidal deposits. We find that all the information in the bond-orientational order parameters is well captured by persistent homology analysis methods that only use the centers of the particles as input data. It is expected that these methods will prove useful in characterizing other disordered structures.

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