Migration by the diffraction stack method

Mohanty, Priya Ranjan (1984) Migration by the diffraction stack method. Masters thesis, Memorial University of Newfoundland.

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    Available under License - The author retains copyright ownership and moral rights in this thesis. Neither the thesis nor substantial extracts from it may be printed or otherwise reproduced without the author's permission.
    (Original Version)

Abstract

Computer programmes were developed to implement the diffraction stack migration scheme. In order to test the above technique, zero offset synthetic seismograms were generated for two simple models; a dipping layer and an anticline. Later the diffraction stack algorithm was applied to the field seismic data for the Adolphus structure. -- The general structure of the subsurface reflectors were better clarified in the migrated sections than the unmigrated sections for both synthetic and field seismic data. The anticline breadth was reduced in both synthetic and field migrated sections after collapsing the diffraction patterns generated at the sharp boundaries. The salt flank in Adolphus structure was delineated better than the original stacked section. It is also observed from migrated sections on the two synthetic models that the diffraction stack method works efficiently for steep dip reflectors up to dip angle 40 degrees.

Item Type: Thesis (Masters)
URI: http://research.library.mun.ca/id/eprint/6742
Item ID: 6742
Additional Information: Bibliography: leaves 108-112.
Department(s): Science, Faculty of > Earth Sciences
Date: 1984
Date Type: Submission
Library of Congress Subject Heading: Seismic reflection method--Data processing; Seismic reflection method--Deconvolution

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